Silicon strip defects and their impact on electrical performance of readout electronics

Abstract In preparation for the High Luminosity LHC (HL-LHC) runs, ATLAS inner detector will be completely replaced with an all silicon Inner Tracker (ITk). Hybrid pixel modules used innermost tracking layers, and micro-strip detectors outer layers of tracker. During production detector, sensors, readout electronics, other components undergo a series quality control (QC) assurance tests. Defects in fabrication sensors flagged early manufacturer's QC A study influence sensor defects was performed to assess characteristics these completed modules, whether any defect posed risk operation front-end electronics. All were found have no impact on performance electronics healthy amplifier channels, that short coupling between strip implant metal electrode only noticeable leakage currents excess 250 nA, beyond end-of-life expected most at HL-LHC.